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Convergent‐beam electron diffraction III, by M. Tanaka, M. Terauchi, and K. Tsuda. JEOL, Tokyo, Japan, 1994, 308 pp, $160.00
Author(s) -
Eades Alwyn
Publication year - 1995
Publication title -
microscopy research and technique
Language(s) - Uncategorized
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070320309
Subject(s) - citation , electron diffraction , history , library science , art history , engineering physics , physics , diffraction , computer science , optics