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On the use of local statistical properties in focusing microscopy images
Author(s) -
Lipton Alan,
Breen Edmond J.
Publication year - 1995
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070310411
Subject(s) - focus (optics) , microscopy , discernment , histogram , artificial intelligence , computer science , computer vision , optical microscope , image (mathematics) , optics , pattern recognition (psychology) , physics , scanning electron microscope , philosophy , epistemology
Techniques to extract focus properties of microscopy images are many and varied. Many of them, however, rely on the summation of local statistical properties. Presented here is an examination of conventional focus determination algorithms, and a new method based on planar histograms of these local statistical properties. It is shown that this new method provides finer discernment of the focus properties of an image, and provides a means to extend the focus of an optical microscopy system. © 1995 Wiley‐Liss, Inc.