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A utilization of the phase spectrum for the correction of image drift in high resolution transmission electron microscopy
Author(s) -
Ichise Norihiko,
Ogasawara Mitsuo,
Baba Norio
Publication year - 1995
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070300410
Subject(s) - transmission electron microscopy , phase (matter) , resolution (logic) , high resolution transmission electron microscopy , transmission (telecommunications) , energy filtered transmission electron microscopy , electron microscope , microscopy , materials science , optics , scanning transmission electron microscopy , physics , computer science , artificial intelligence , telecommunications , quantum mechanics
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