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Calculation of overall tilt angles for a double tilt holder in a TEM
Author(s) -
Kelly Patrick M.,
Wauchope Corinna J.,
Zhang Xuezhi
Publication year - 1994
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070280512
Subject(s) - tilt (camera) , optics , materials science , physics , geometry , mathematics
A simple formula has been derived for the tilt angle of a specimen in terms of the two tilt angles of a side entry, double tilt holder in a transmission electron microscope. An expression for calculating the direction of the apparent tilt axis in relation to the observed diffraction pattern has also been derived. The accuracy and reproducibility of specimen tilting has been assessed experimentally. © 1994 Wiley‐Liss, Inc.