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A simplified mode of differential phase contrast lorentz microscopy
Author(s) -
Kraut S.,
Cowley J. M.
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070250411
Subject(s) - phase contrast microscopy , microscopy , differential interference contrast microscopy , contrast (vision) , phase (matter) , differential (mechanical device) , lorentz transformation , optics , materials science , physics , classical mechanics , thermodynamics , quantum mechanics
A simplified mode of differential phase contrast Lorentz microscopy for the study of magnetic domain structures in thin films is proposed and demonstrated. This mode employs a single annular detector in a scanning transmission electron microscope rather than the specialized split detectors that have been previously used. The resulting signal is sufficiently linear with magnetic field strength to allow quantitative data to be obtained on the domain configurations and the natures of the domain walls. © 1993 Wiley‐Liss, Inc.