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High‐resolution transmission electron microscopy of hexagonal and rhombohedral molybdenum disulfide crystals
Author(s) -
Isshiki Toshiyuki,
Nishio Koji,
Saijo Hiroshi,
Shiojiri Makoto,
Yabuuchi Yasufumi,
Takahashi Noboru
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070250409
Subject(s) - molybdenum disulfide , high resolution transmission electron microscopy , transmission electron microscopy , molybdenite , crystallography , stacking , materials science , stacking fault , molybdenum , electron diffraction , electron microscope , partial dislocations , selected area diffraction , dislocation , diffraction , optics , chemistry , nanotechnology , physics , composite material , metallurgy , fluid inclusions , quartz , organic chemistry
Natural (molybdenite) and synthesized molybdenum disulfide crystals have been studied by high‐resolution transmission electron microscopy. The image simulation demonstrates that the [0001] and [01 1 0] HRTEM images of hexagonal and rhombohedral MoS 2 crystals hardly disclose their stacking sequences, and that the [2 1 1 0] images can distinguish the Mo and S columns along the incident electron beam and enable one to determine not only the crystal structure but also the fault structure. Observed [0001] images of cleaved molybdenite and synthesized MoS 2 crystals, however, reveal the strain field around partial dislocations limiting an extended dislocation. A cross‐sectional image of a single molecular (S‐Mo‐S) layer cleaved from molybdenite has been observed. Synthesized MoS 2 flakes which were prepared by grinding have been found to be rhombohedral crystals containing many stacking faults caused by glides between S/S layers. © 1993 Wiley‐Liss, Inc.