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A new software package for interpreting electron diffraction contrast images of arbitrary displacement fields: SIMCON
Author(s) -
Janssens Koenraad G. F.,
Vanhellemont Jan,
van der Biest Omer
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070250209
Subject(s) - citation , information retrieval , computer science , physics , library science , algorithm
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