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Contrast enhancement and polymer identification in the electron microscope by the formation and staining of unsaturated double bonds
Author(s) -
Parker M. A.,
Vesely D.
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070240406
Subject(s) - osmium tetroxide , electron microscope , polymer , double bond , osmium , irradiation , negative stain , staining , electron beam processing , resolution (logic) , chemistry , materials science , analytical chemistry (journal) , polymer chemistry , optics , organic chemistry , ruthenium , physics , medicine , pathology , artificial intelligence , nuclear physics , computer science , catalysis
A new technique for the identification of phases contained within a polymer blend is described in this paper. The technique utilises the beam damage which occurs when polymers are irradiated in an electron microscope. It has been found that during the irradiation process isolated double bonds are formed which can be revealed by staining with osmium tetroxide. The density of staining and its relationship to electron exposure is shown to be a characteristic feature of a particular chemical structure. It allows for polymer phase identification with a high spatial resolution and also for contrast enhancement and preservation. This technique offers a unique way of studying a fine dispersion of phases in polymer blends, even where only low atomic number elements such as C, H, and O are present. © 1993 Wiley‐Liss, Inc.