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Microscopy in solid state science
Author(s) -
McGibbon A. J.,
Brown L. M.,
Bleloch A. L.,
Browning N. D.,
Cadete Santos Aires F.,
Fallon P. J.,
Gaskell P. H.,
Gilkes K. W. R.,
Hansen P. L.,
Howie A.,
Maynard A. D.,
McComb D. W.,
McMullan D.,
Müllejans H.,
Murooka Y.,
Paterson J. H.,
Perovic D. D.,
Pike W. T.,
Rauf I. A.,
Rodenburg J. M.,
Saeed A.,
Stelmashenko N.,
Tu K. N.,
Walls M. G.,
Walsh C. A.,
Yuan J.,
Zhao J.
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070240404
Subject(s) - scanning transmission electron microscopy , solid state , cover (algebra) , transmission electron microscopy , nanotechnology , range (aeronautics) , spectroscopy , electron energy loss spectroscopy , materials science , engineering physics , physics , engineering , mechanical engineering , composite material , quantum mechanics
The Microstructural Physics group at the Cavendish Laboratory is actively involved in a considerable number of research projects which cover a broad range of materials science. In this paper, we describe briefly several such projects, with particular emphasis given to the application of parallel‐detection electron energy loss spectroscopy (PEELS) on a scanning transmission electron microscope (STEM) to the analysis of materials such as stainless steels, catalysts, and high temperature superconductors. In addition, we describe a number of related projects that are currently being carried out in the group, particularly those which utilise and develop novel STEM imaging and analytical techniques. © 1993 Wiley‐Liss, Inc.