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The effect of aluminium coating on elemental signals in X‐ray microanalysis
Author(s) -
Reid A. P.,
Oates K.,
Potts W. T. W.
Publication year - 1993
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070240208
Subject(s) - microanalysis , aluminium , coating , materials science , electron microscope , elemental analysis , scanning electron microscope , analytical chemistry (journal) , electron probe microanalysis , metallurgy , chemistry , optics , nanotechnology , composite material , physics , inorganic chemistry , organic chemistry , chromatography
It has been determined that, in the normal range of aluminium coating thicknesses used to remove charge from non‐conducting specimens in the electron microscope, no detectable influence on the elemental signals obtained in X‐ray microanalysis is observed. This is in contrast to a previous report (Hopkins et al., J. Electron Microsc. Tech., 18:176–182, 1991) of a reduction in elemental signal with increasing aluminium coating thickness. An explanation of errors in the previous interpretation is provided. © 1993 Wiley‐Liss, Inc.