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Observation by transmission electron microscopy of etch figures obtained on an organic molecular crystal
Author(s) -
Mercier Michel,
Raimi Mohamed Karim,
Bonpunt Louis
Publication year - 1992
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070210108
Subject(s) - sublimation (psychology) , crystal (programming language) , transmission electron microscopy , materials science , etch pit density , crystallography , optics , mineralogy , chemistry , nanotechnology , etching (microfabrication) , physics , computer science , psychology , psychotherapist , programming language , layer (electronics)
It is interesting to apply the method of etch figures to the study of organic molecular crystal defects, by observing the etch pits as soon as they are produced. We have set up a method to determine the geometrical forms of such small etch pits, observed on pre‐shadowed replicas of naphthalene crystal surfaces. The described experimental procedure was designed to avoid artefacts due to vacuum sublimation and moisture traces on the replicated surface. Stereoscopic observation makes interpretation possible. The 3‐D morphology and size of etch figures smaller than 1 μm can be determined.