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Scanning electron microscopy of negatively stained catalase on a silicon wafer
Author(s) -
Furuno Taiji,
Ulmer Kevin M.,
Sasabe Hiroyuki
Publication year - 1992
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070210105
Subject(s) - scanning electron microscope , wafer , silicon , phosphotungstic acid , resolution (logic) , materials science , electron microscope , monolayer , catalase , analytical chemistry (journal) , chemistry , nanotechnology , optoelectronics , optics , chromatography , composite material , enzyme , biochemistry , catalysis , physics , artificial intelligence , computer science
A high‐resolution scanning electron microscope capable of 7 Å spatial resolution at 30‐kV accelerating voltage was used to observe negatively stained protein molecules. Thin platelet crystals, densely packed monolayers, and low‐density deposits of beef liver catalase were prepared on the surface of silicon wafers and negatively stained with phosphotungstic acid. The tetrameric structure of the catalase molecule was observed for the first time by scanning electron microscopy on the surface of the smooth silicon wafer.