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Observation of surfaces by reflection electron holography
Author(s) -
Osakabe Nobuyuki
Publication year - 1992
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070200415
Subject(s) - electron holography , holography , optics , reflection (computer programming) , electron , reflection high energy electron diffraction , interferometry , wavelength , electron microscope , materials science , holographic interferometry , physics , electron diffraction , diffraction , programming language , quantum mechanics , computer science
Reflection electron holography is described as a method to observe sub‐Å surface morphology. Phase shift of a Bragg‐reflected electron wave was measured by means of holographic interferometry using an electron microscope equipped with a field emission electron gun and an electron biprism. A short wavelength of high energy electrons is the essential key to the high vertical sensitivity of this method, since geometrical path differences produced by the surface topography are measured in units of wavelengths in interferometrical measuring. Phase shift at a monoatomic step and the displacement field around a dislocation emerging on the surface were observed.