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Observation of double line contrast in surface imaging
Author(s) -
Yao Nan,
Cowley John M.
Publication year - 1992
Publication title -
microscopy research and technique
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.536
H-Index - 118
eISSN - 1097-0029
pISSN - 1059-910X
DOI - 10.1002/jemt.1070200411
Subject(s) - contrast (vision) , optics , reflection (computer programming) , diffraction , resonance (particle physics) , line (geometry) , bragg's law , nuclear magnetic resonance , materials science , high contrast , physics , atomic physics , mathematics , geometry , computer science , programming language
The double line contrast of a single‐atom height step observed in surface imaging for a single crystal in reflection electron microscopy is studied under a variety of experimental conditions. It is suggested that this abnormal contrast is directly associated with the dynamical electron diffraction process. The behavior of the double line contrast is closely related to the order of the Bragg reflected beam, and can be observed mostly under one of the two commonly cited resonance conditions. This phenomenon clearly reveals the differences in the surface imaging for various resonance conditions.