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Application of stepped light‐induced transient measurements of photocurrent and photovoltage in charge‐transfer mechanism characterization
Author(s) -
Zhao Long
Publication year - 2018
Publication title -
journal of the chinese chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.329
H-Index - 45
eISSN - 2192-6549
pISSN - 0009-4536
DOI - 10.1002/jccs.201800196
Subject(s) - photocurrent , chemistry , transient (computer programming) , electron transfer , optoelectronics , electrolyte , dye sensitized solar cell , characterization (materials science) , electron , light intensity , diffusion , analytical chemistry (journal) , atomic physics , optics , nanotechnology , electrode , materials science , photochemistry , thermodynamics , physics , quantum mechanics , chromatography , computer science , operating system
The stepped light‐induced transient measurements of photocurrent and photovoltage (SLIM‐PCV) method has been applied in tackling electron lifetime and electron diffusion coefficients in dye‐sensitized solar cells (DSSCs) for the last 13 years. This technique on kinetic measurement is straightforward, and thus, the trace of electron transfer during the variation of laser intensity is clearly recorded. Furthermore, by slight optimization on the SLIM‐PCV setup, electron density at either open circuit or short circuit conditions could be measured. These investigation approaches are of great importance to understanding device behavior and limiting factors at the dye/TiO 2 /electrolyte interface in DSSCs. In this article, the setup and measuring principle of this technique were outlined, and relative measurements were explicitly demonstrated.