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Photosensitivity of CuBiSe 2 Thin Film Deposited by Vacuum Evaporation Technique
Author(s) -
Muthukannan Abirami,
Prema Pasunkili,
Henry Johnson,
Mohanraj Kannusamy,
Sivakumar Ganesan
Publication year - 2016
Publication title -
journal of the chinese chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.329
H-Index - 45
eISSN - 2192-6549
pISSN - 0009-4536
DOI - 10.1002/jccs.201600189
Subject(s) - photosensitivity , evaporation , thin film , band gap , chemistry , scanning electron microscope , vacuum evaporation , analytical chemistry (journal) , absorption (acoustics) , diffraction , absorption spectroscopy , visible spectrum , surface roughness , optics , optoelectronics , nanotechnology , materials science , composite material , physics , chromatography , thermodynamics
CuBiSe 2 (CBSe) thin film was prepared by vacuum evaporation. The deposited film was characterized by X‐ray diffraction ( XRD) , scanning electron microscopy ( SEM) , atomic force microscopy ( AFM) , energy dispersive X‐ray ( EDX) , UV –visible specroscopy, and I–V analysis. XRD analysis indicates the formation of cubic CBSe thin film, and the corresponding EDX spectrum confirms the stoichiometry composition of CBSe . In the AFM images, the majority of the particles are granular, and the surface roughness is 8.86 nm. The optical absorption coefficient is >10 4 in the visible region and the bandgap energy is calculated to be 1.84 eV . The photosensitivity of the film is 181%.