Photosensitivity of  CuBiSe 2   Thin Film Deposited by Vacuum Evaporation Technique | Zendy

Muthukannan Abirami | Zendy; Prema Pasunkili | Zendy; Henry Johnson | Zendy; Mohanraj Kannusamy | Zendy; Sivakumar Ganesan | Zendy

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Photosensitivity of CuBiSe 2 Thin Film Deposited by Vacuum Evaporation Technique

Author(s) -

Muthukannan Abirami,

Prema Pasunkili,

Henry Johnson,

Mohanraj Kannusamy,

Sivakumar Ganesan

Publication year - 2016

Publication title -

journal of the chinese chemical society

Language(s) - English

Resource type - Journals

SCImago Journal Rank - 0.329

H-Index - 45

eISSN - 2192-6549

pISSN - 0009-4536

DOI - 10.1002/jccs.201600189

Subject(s) - photosensitivity , evaporation , thin film , band gap , chemistry , scanning electron microscope , vacuum evaporation , analytical chemistry (journal) , absorption (acoustics) , diffraction , absorption spectroscopy , visible spectrum , surface roughness , optics , optoelectronics , nanotechnology , materials science , composite material , physics , chromatography , thermodynamics

CuBiSe 2 (CBSe) thin film was prepared by vacuum evaporation. The deposited film was characterized by X‐ray diffraction ( XRD) , scanning electron microscopy ( SEM) , atomic force microscopy ( AFM) , energy dispersive X‐ray ( EDX) , UV –visible specroscopy, and I–V analysis. XRD analysis indicates the formation of cubic CBSe thin film, and the corresponding EDX spectrum confirms the stoichiometry composition of CBSe . In the AFM images, the majority of the particles are granular, and the surface roughness is 8.86 nm. The optical absorption coefficient is >10 4 in the visible region and the bandgap energy is calculated to be 1.84 eV . The photosensitivity of the film is 181%.

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