Forensic Application of Atomic Force Microscopy ― Questioned Document

As the field of nanotechnology develops several material and structure in nano‐scale has become part of our daily life. By the steady improvement of current nanotechnology and detection methods, scientific discovery can progress considerably in the long run. Recently, these precise detecting methods have caught the eyes of forensic circle around the world. One of the most notable is atomic force microscopy (AFM), which performs imaging based on the interactive force between the probe and the sample surface. Compared to other optical microscopy, in the area of detecting surface on nano‐scale, AFM demonstrates several advantages such as its non‐destructive nature and its ability to produce high resolution images and detect different properties of a sample (height, viscoelasticity, and electromagnetism). In Taiwan, this area still remains untouched, although many notable applications of this technique have been reported. This report follows the developments mentioned above, utilizes the advantages of AFM, progressing the first step in analyzing forensic exhibits. It is our hope that AFM will become a new detection method in the domestic forensic area, and allow us to keep up with international developments.