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Classical Cascade Calculations on the Analysis of Surface Bonding Structures by Secondary Particle Mass Spectrometry
Author(s) -
Chang CheChen
Publication year - 1994
Publication title -
journal of the chinese chemical society
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.329
H-Index - 45
eISSN - 2192-6549
pISSN - 0009-4536
DOI - 10.1002/jccs.199400046
Subject(s) - sputtering , chemistry , particle (ecology) , mass spectrometry , collision cascade , atomic physics , static secondary ion mass spectrometry , surface (topology) , secondary ion mass spectrometry , molecular physics , analytical chemistry (journal) , thin film , nanotechnology , materials science , geometry , physics , chromatography , oceanography , mathematics , geology
The application of secondary particle mass spectrometry to analyze the atomic bonding configuration on a surface was investigated with computer calculations of particle sputtering from an Ar‐bombarded surface of Ag{111}. In contrast to the prediction from the present sputtering theory, better resolved structure in the angular distribution was not observed for particles of high energy sputtered from the surface. These particles ejected to a wide angle and their angular distribution may not reflect well the atomic bonding geometry on the surface. The analytical capability of secondary particle mass spectrometry to determine surface structures can be significantly improved by selecting for detection only those particles that have prolonged collisions. The preferred directions of ejection and the relative sputtering intensity in the distribution of azimuthal angle between major open channels on the surface vary insignificantly with the duration of collision in the regime of long collisions. The results provide the first evidence that at small energies of sputtering the particles emitted from the surface may contain information about only the top two surface layers. Secondary particle mass spectrometry can thus be extremely surface sensitive for analysis of properties of solid surfaces.