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Enhanced lateral resolution in continuous wave stimulated emission depletion microscopy using tightly focused annular radially polarized excitation beam
Author(s) -
Lim Geon,
Kim WanChin,
Oh Seunghee,
Lee Hyungsuk,
Park NoCheol
Publication year - 2019
Publication title -
journal of biophotonics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 66
eISSN - 1864-0648
pISSN - 1864-063X
DOI - 10.1002/jbio.201900060
Subject(s) - sted microscopy , optics , super resolution microscopy , microscopy , stimulated emission , confocal microscopy , point spread function , excitation , full width at half maximum , beam (structure) , resolution (logic) , confocal , materials science , laser , physics , scanning confocal electron microscopy , quantum mechanics , artificial intelligence , computer science
The lateral resolution of continuous wave (CW) stimulated emission depletion (STED) microscopy is enhanced about 12% by applying annular‐shaped amplitude modulation to the radially polarized excitation beam. A focused annularly filtered radially polarized excitation beam provides a more condensed point spread function (PSF), which contributes to enhance effective STED resolution of CW STED microscopy. Theoretical analysis shows that the FWHM of the effective PSF on the detection plane is smaller than for conventional CW STED. Simulation shows the donut‐shaped PSF of the depletion beam and confocal optics suppress undesired PSF sidelobes. Imaging experiments agree with the simulated resolution improvement.