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In situ non‐destructive measurement of biofilm thickness and topology in an interferometric optical microscope
Author(s) -
Larimer Curtis,
Suter Jonathan D.,
Bonheyo George,
Addleman Raymond Shane
Publication year - 2016
Publication title -
journal of biophotonics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.877
H-Index - 66
eISSN - 1864-0648
pISSN - 1864-063X
DOI - 10.1002/jbio.201500212
Subject(s) - biofilm , in situ , materials science , surface roughness , surface finish , white light interferometry , topology (electrical circuits) , interferometry , optical microscope , optics , composite material , chemistry , bacteria , geology , scanning electron microscope , physics , mathematics , paleontology , organic chemistry , combinatorics
Biofilms are ubiquitous and impact the environment, human health, dental hygiene, and a wide range of industrial processes. Biofilms are difficult to characterize when fully hydrated, especially in a non‐destructive manner, because of their soft structure and water‐like bulk properties. Herein a method of measuring and monitoring the thickness and topology of live biofilms of using white light interferometry is described. Using this technique, surface morphology, surface roughness, and biofilm thickness were measured over time without while the biofilm continued to grow. The thickness and surface topology of a P. putida biofilm were monitored growing from initial colonization to a mature biofilm. Measured thickness followed expected trends for bacterial growth. Surface roughness also increased over time and was a leading indicator of biofilm growth.