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Metrology and Image Quality Play Starring Roles at Display Week 2017
Author(s) -
Fiske Tom
Publication year - 2017
Publication title -
information display
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.182
H-Index - 20
eISSN - 2637-496X
pISSN - 0362-0972
DOI - 10.1002/j.2637-496x.2017.tb01025.x
Subject(s) - metrology , quality (philosophy) , image quality , center (category theory) , computer science , computer graphics (images) , engineering , engineering drawing , image (mathematics) , artificial intelligence , optics , physics , quantum mechanics , chemistry , crystallography
Metrology technology sessions and exhibits were much in evidence this year, highlighted by the first‐ever metrology training course at Display Week. Image quality also took center stage, with high‐dynamic‐range (HDR) technology featured on and off the show floor.