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3.2.3 Development of OMS/MP for the System Reliability
Author(s) -
Lee KyoungHaeng,
Kwon YongSoo,
Kim ChulWhan
Publication year - 2009
Publication title -
incose international symposium
Language(s) - English
Resource type - Journals
ISSN - 2334-5837
DOI - 10.1002/j.2334-5837.2009.tb00959.x
Subject(s) - reliability (semiconductor) , reliability engineering , process (computing) , computer science , work in process , work (physics) , systems engineering , engineering , operating system , mechanical engineering , power (physics) , operations management , physics , quantum mechanics
This work describes an essential process of reliability analysis in weapon systems. The OMS/MP providing essential data of RAM analysis must be prepared by user. However, data acquisition quantified by operational environment of the systems and related instructions are now insufficient to the reliable systems acquisition. OMS/MP based RAM factor is an essential requirements in reliability model analysis. The process of reliability analysis is also often done with an insufficient understanding of OMS/MP. This work proposed the improved reliability analysis process with RELEX. It is shown that the process is a good reasonable by its application of the weapon systems.