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2.2.2 Integration and test strategies for semiconductor manufacturing equipment 1
Author(s) -
Jong I.S.M.,
Boumen R.,
MortelFronczak J.M.,
Rooda J.E.
Publication year - 2006
Publication title -
incose international symposium
Language(s) - English
Resource type - Journals
ISSN - 2334-5837
DOI - 10.1002/j.2334-5837.2006.tb02742.x
Subject(s) - test (biology) , time to market , test strategy , computer science , quality (philosophy) , semiconductor device fabrication , manufacturing engineering , integration testing , set (abstract data type) , system integration , industrial engineering , reliability engineering , systems engineering , engineering , paleontology , philosophy , software , epistemology , wafer , electrical engineering , biology , programming language , operating system
The complexity of semiconductor manufacturing equipment is growing. This growth results in a complexity increase of the integration and test phase of these systems. Simply adding more test resources is not possible anymore, because of the cost involved. A better design of an integration and test strategy can help to optimize this hectic phase. However, methods to design and evaluate integration and test strategies for multi‐disciplinary systems are hardly available. In this paper, we present a method to design and compare integration and test strategies. Following this method, an optimal integration and test strategy can be chosen from a set of possible strategies. A case has been performed where a system is integrated and tested using three different integration and test strategies: a time‐to‐market‐driven strategy, a quality‐driven strategy and a combined quality and time‐to‐market strategy.