Open AccessINTERPRETATIONS OF RELIABILITY
Author(s) -
Haberman Shelby J.
Publication year - 2005
Publication title -
ets research report series
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.235
H-Index - 5
ISSN - 2330-8516
DOI - 10.1002/j.2333-8504.2005.tb02006.x
Subject(s) - bivariate analysis , reliability (semiconductor) , interpretation (philosophy) , joint probability distribution , measure (data warehouse) , probabilistic logic , statistics , distribution (mathematics) , mathematics , econometrics , computer science , data mining , mathematical analysis , power (physics) , physics , quantum mechanics , programming language
Some probabilistic illustrations of the reliability coefficient are provided to assist in interpretation of this measure. All explanations are derived under the assumption that the joint distribution of examinee scores from two parallel tests is well approximated by a bivariate normal distribution.