Open AccessTHE RELIABILITY OF SPEEDED TESTS
Author(s) -
Gulliksen Harold
Publication year - 1950
Publication title -
ets research bulletin series
Language(s) - English
Resource type - Journals
eISSN - 2333-8504
pISSN - 0424-6144
DOI - 10.1002/j.2333-8504.1950.tb00876.x
Subject(s) - reliability (semiconductor) , standard deviation , section (typography) , statistics , test (biology) , computer science , absolute deviation , test data , mathematics , algorithm , paleontology , power (physics) , physics , quantum mechanics , biology , operating system , programming language
Some methods are presented for estimating the reliability of a partially speeded test without the use of a parallel form. The effect of these formulas on some test data is illustrated. Whenever an odd‐even reliability is computed, it is probably desirable to use one of the formulas noted in Section 2 of this paper in addition to the usual Spearman‐Brown correction. Since the formulas given here involve the mean and standard deviation of the “number unattempted score”, a method is given in Section 4 for computing this mean and standard deviation from item analysis data. If the item analysis data are available, this method will save considerable time as compared with rescoring answer sheets.