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P‐105: Modelling of Liquid Crystals at the Pixel Edge
Author(s) -
Nie Zijun,
Day Sally E.,
Fernández F. Anibal,
Willman Eero,
James Richard
Publication year - 2014
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2014.tb00364.x
Subject(s) - pixel , planar , liquid crystal on silicon , liquid crystal , materials science , enhanced data rates for gsm evolution , threshold voltage , electrode , voltage , resolution (logic) , phase (matter) , optoelectronics , liquid crystal display , crystal (programming language) , optics , computer science , physics , electrical engineering , computer graphics (images) , telecommunications , engineering , artificial intelligence , transistor , quantum mechanics , programming language
Modelling has been carried out of the Liquid Crystal structures at the edges of electrodes for planar aligned devices, used as phase modulators. The voltage dependence and a threshold voltage of the defect formation is found. The effect of adjacent pixels used in high resolution in LCOS is investigated.