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P.44: Display Aspect Simulation using Measured Emissive and Reflective Display Imperfections
Author(s) -
Boher Pierre,
Leroux Thierry,
CollombPatton Véronique,
Big Thibault
Publication year - 2013
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2013.tb06433.x
Subject(s) - optics , viewing angle , wavelength , angle of incidence (optics) , observer (physics) , materials science , azimuth , reflection (computer programming) , computer science , physics , liquid crystal display , quantum mechanics , programming language
A method for accurate physico‐realistic aspect simulations of any display taking into account most of its imperfections is presented. The emissive properties of the display are measured locally versus incidence and azimuth angles, and globally at normal incidence for the entire display surface. A key point of the method is the integration of the wavelength dependence of the reflective properties of the display in order to compute the impact of any kind of lighting environment. This wavelength dependence is measured using a new Fourier optics viewing angle instrument able to measure the BRDF properties of any surface versus angle and wavelength very rapidly. For a given ambient lighting the unwanted reflections that corrupt contrast and color are simulated. We use innovative wavelet‐based tree decomposition to compress and interpolate the data rapidly. The display aspect for an observer anywhere in front of it can be obtained rapidly for any content and the impact of the different imperfections can be visualized.