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38.2: Comparative Analysis of Alignment Characteristics of Polyimide Films Using Near Edge X‐ray Adsorption Fine Structure
Author(s) -
Kwak Musun,
Kim Kyoungri,
Choi Seungkyu,
Kim Nakwon,
Kang Dongwoo,
Choi Youngseok,
Jeon Suho,
Kim Kijeong,
Kim Bongsoo
Publication year - 2013
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2013.tb06262.x
Subject(s) - annealing (glass) , polyimide , materials science , xanes , adsorption , crystallography , optics , analytical chemistry (journal) , composite material , layer (electronics) , chemistry , spectroscopy , chromatography , physics , organic chemistry , quantum mechanics
We studied the structural characteristics of poly imides (PI) chains according to the film thickness and the temperature treatment using the angle resolved near edge X‐ray adsorption fine structure (AR‐NEXAFS). The molecular directional angle a of the twisted nematic (TN) and the in‐plane switching (IPS) mode alignment film (AF) decrease the tilt angle as increasing the film thickness. These films also shows the temperature dependence of C=C * according to the annealing conditions. In case TN mode sample lost its angular dependency after annealing 230 °C for 2400 sec on the hot plate, but IPS mode sample maintained its angular dependency after same annealing condition with TN mode sample.