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P‐124: Effect of Electrical Aging on Reliability of Solution In Organic Light Emitting Diode
Author(s) -
Park HyunAe,
Choi SungHo,
Choi ByoungDeog,
Lee SunHee,
Song WonJun,
Kim SungChul
Publication year - 2012
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2012.tb06103.x
Subject(s) - reliability (semiconductor) , materials science , oled , optoelectronics , diode , capacitance , doping , equivalent series resistance , accelerated aging , voltage , light emitting diode , electrical engineering , composite material , chemistry , electrode , engineering , physics , power (physics) , layer (electronics) , quantum mechanics
We applied voltage on fabricated OLED with electrical aging in order to investigate the reliability of OLEDs. According to aging times, the decrease of initial capacitance by electrical stress because of the increasing the series resistance and decreasing the carrier doping density of emission states caused by moving fixed charge.