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P‐66: Accelerated Life Test (ALT) Evaluation Method for Backlight LEDs
Author(s) -
Hsieh IHsun,
Hsieh KunHung,
Wang ChihKai,
Ke WeiChih,
Wang HsinMien
Publication year - 2012
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2012.tb06042.x
Subject(s) - backlight , light emitting diode , junction temperature , luminance , materials science , diode , optoelectronics , optics , physics , liquid crystal display , thermodynamics , power (physics)
Abstract A backlight light‐emitting diodes (LEDs) accelerated life test method can indicate that the life time of the 20.1“/55” backlight LEDs are about 24,000/67,000 hours under around 2,000 hours test time. The accelerated life test estimates LEDs lifetime in normal use by operating LEDs at high environmental stresses. Generally, the homogenous LEDs life degradation behavior follows an exponential curve. The junction temperature (Tj) is the key factor for LEDs lifetime estimation. The empirical result of homogenous luminance exponential over‐time degradation is related with the junction temperature during ALT.