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P‐6: A New Integrated Scan Driver using Oxide TFTs with Negative Threshold Voltage
Author(s) -
Huh Jin,
Cho GyuHyeong
Publication year - 2012
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2012.tb05975.x
Subject(s) - spice , amoled , threshold voltage , voltage , capacitor , overdrive voltage , materials science , electrical engineering , thin film transistor , oxide , computer science , electronic engineering , optoelectronics , engineering , transistor , active matrix , nanotechnology , layer (electronics) , metallurgy
A new integrated scan driver composed of oxide TFTs with a negative threshold voltage is proposed for LCDs and AMOLED displays. By introducing a new circuit, which consists of two clock sets, SCLKs and PCLKs, with different low voltage levels and two DC voltage sources, V H and V L , the effect of a high off‐current of oxide TFTs at V GS = 0V was minimized and thus the scan driver showed stable operation by the negative threshold voltage of −2V. Furthermore, the proposed driver requires only two capacitors; therefore, it can be compactly implemented on a panel without additional increase of area. The operation of the proposed scan driver was fully verified by SPICE simulations.