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18.3: 3‐D Metrology System based on a Bi‐directional OLED Microdisplay
Author(s) -
Großmann Constanze,
Gawronski Ute,
Breitbarth Martin,
Baumgarten Judith,
Notni Gunther,
Tünnermann Andreas
Publication year - 2012
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2012.tb05757.x
Subject(s) - oled , metrology , cmos , optoelectronics , chip , photoelectric effect , computer science , materials science , physics , optics , nanotechnology , telecommunications , layer (electronics)
Bi‐directional OLED based microdisplays offer interesting possibilities for new applications. Light emission and detection is included in one chip by using OLED‐on‐CMOS‐technology. Such device has been primary made for optocouplers or photoelectric barriers, but it offers interesting possibilities for other application fields, e.g. multimedia and metrology. A new optical concept of a 3‐D metrology sensor based on bi‐directional OLED microdisplay will be presented.