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3.3: High‐Speed Shift‐Register for High Resolution AMD with Self‐aligned Coplanar a‐IGZO TFTs
Author(s) -
Geng Di,
Kang Dong Han,
Seok Man Ju,
Mativenga Mallory,
Jang Jin
Publication year - 2012
Publication title -
sid symposium digest of technical papers
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.351
H-Index - 44
eISSN - 2168-0159
pISSN - 0097-966X
DOI - 10.1002/j.2168-0159.2012.tb05694.x
Subject(s) - thin film transistor , materials science , shift register , optoelectronics , high resolution , amorphous solid , transistor , ripple , resolution (logic) , electrical engineering , voltage , nanotechnology , computer science , electronic circuit , chemistry , engineering , layer (electronics) , crystallography , remote sensing , geology , artificial intelligence
We report a high speed shift register (SR) for high resolution AMD using self‐aligned coplanar amorphous‐indium‐gallium‐zinc‐oxide (a‐IGZO) thin‐film transistors (TFTs). The SR could operate with clock frequency of 500 kHz without any distortion and ripple at a supply voltage (V DD ) of 15 V, which confirm the use of a‐IGZO TFT shift registers for high‐speed and high resolution AMD.