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Neural Tube Defects in Association with Copper Intrauterine Devices
Author(s) -
Graham David,
Enkin Murray,
deSa D.
Publication year - 1980
Publication title -
international journal of gynecology and obstetrics
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.895
H-Index - 97
eISSN - 1879-3479
pISSN - 0020-7292
DOI - 10.1002/j.1879-3479.1980.tb00529.x
Subject(s) - medicine , anencephaly , pregnancy , obstetrics , neural tube , gestation , neural tube defect , copper , fetus , family planning , population , research methodology , embryo , metallurgy , genetics , microbiology and biotechnology , environmental health , materials science , biology
Copper‐bearing intrauterine devices are being increasingly used for contraception. A growing number of pregnancies, which may subsequently carry to term, are therefore being exposed to high levels of copper at the critical period of organogenesis, with risk of possible teratogenesis. Two cases of anencephaly occurring in association with these devices are reported.