Premium
ELECTRON MICROSCOPIC DETERMINATION OF SPECIFIC LEAF SURFACE AREA
Author(s) -
Hsieh J. J. C.,
Thomas J. M.
Publication year - 1970
Publication title -
american journal of botany
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 1.218
H-Index - 151
eISSN - 1537-2197
pISSN - 0002-9122
DOI - 10.1002/j.1537-2197.1970.tb09856.x
Subject(s) - biology , replica , surface (topology) , begonia , penetration (warfare) , botany , geometry , mathematics , art , operations research , visual arts
A method for the estimation of specific leaf surface area was developed as an aid in the interpretation of radionuclide penetration or gas diffusion data. The estimate was obtained by comparing the contour of the surface with the linear distance of the observed thin cross sections of a leaf replica. The first approximation of the specific surface area of a begonia leaf sample was about 1.6.