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Synthetic‐aperture assessment of a dispersive surface
Author(s) -
Cheney Margaret
Publication year - 2004
Publication title -
international journal of imaging systems and technology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.359
H-Index - 47
eISSN - 1098-1098
pISSN - 0899-9457
DOI - 10.1002/ima.20004
Subject(s) - synthetic aperture radar , waveform , computer science , inversion (geology) , scalar (mathematics) , aperture (computer memory) , optics , inverse synthetic aperture radar , microlocal analysis , antenna aperture , antenna (radio) , acoustics , physics , radar imaging , radiation pattern , radar , geology , telecommunications , mathematics , integral equation , mathematical analysis , computer vision , geometry , paleontology , structural basin , fourier integral operator
Abstract This article considers Synthetic Aperture Radar and other synthetic‐aperture imaging systems in which a backscattered wave is measured from a variety of locations. We focus on the case in which the ground‐reflectivity function depends on frequency as well as on position. We begin with a (linearized) mathematical model, based on a scalar approximation to Maxwell's equations, which includes the effects of the source waveform and the antenna beam pattern. The model can also accommodate other effects such as antenna steering and motion. For this mathematical model, we use the tools of microlocal analysis to develop and analyze a three‐dimensional inversion algorithm that uses measurements made on a surface and determines the frequency‐dependent ground reflectivity. © 2004 Wiley Periodicals, Inc. Int J Imaging Syst Technol 14, 28–34, 2004; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/ima.20004