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The Auger Parameter of Adsorbed Xenon as a Probe of Surface Polarizability
Author(s) -
Stair P. C.
Publication year - 1982
Publication title -
israel journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.908
H-Index - 54
eISSN - 1869-5868
pISSN - 0021-2148
DOI - 10.1002/ijch.198200068
Subject(s) - xenon , auger , chemistry , polarizability , atomic physics , kinetic energy , relaxation (psychology) , auger effect , polarization (electrochemistry) , dielectric , auger electron spectroscopy , molecule , physics , optoelectronics , nuclear physics , psychology , social psychology , organic chemistry , quantum mechanics
The change in Auger parameter, α (α = Auger kinetic energy minus photoelectron kinetic energy from core levels) between gas phase and adsorbed phase xenon provides an unambiguous measure of final state electronic relaxation in the surface toward the xenon ion. For many surfaces this relaxation is purely electronic polarization in the surface so that the Auger parameter provides a measure of the surface polarizability. Moreover, the Auger parameter for adsorbed xenon can be related to the relaxation energy in core level photoemission with high accuracy. Measurement of the xenon Auger parameter and its sensitivity to surface dielectric properties is illustrated by experiments on a series of oxygen treated Mo(100) surfaces.