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Helium Diffraction as a Probe of Surface Structure
Author(s) -
Engel Thomas
Publication year - 1982
Publication title -
israel journal of chemistry
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.908
H-Index - 54
eISSN - 1869-5868
pISSN - 0021-2148
DOI - 10.1002/ijch.198200058
Subject(s) - chemistry , diffraction , electron diffraction , helium , electron , gas electron diffraction , low energy electron diffraction , surface (topology) , solid surface , atomic physics , molecular physics , crystallography , reflection high energy electron diffraction , optics , chemical physics , nuclear physics , physics , geometry , mathematics , organic chemistry
The diffraction of He atoms from solid surfaces has been recently used to determine the electron distribution of electrons at surfaces. From this, the position of underlying atoms can usually be inferred. Recent developments which test the validity of the hard corrugated wall method to calculate diffraction intensities are discussed. Structural studies which have been carried out to date, on various surfaces with He beams, are tabulated.