Premium
Short contribution: A new method of analyzing and documenting micromorphological thin sections using flatbed scanners: Applications in geoarchaeological studies
Author(s) -
Arpin Trina L.,
Mallol Carolina,
Goldberg Paul
Publication year - 2002
Publication title -
geoarchaeology
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.696
H-Index - 44
eISSN - 1520-6548
pISSN - 0883-6353
DOI - 10.1002/gea.10014
Subject(s) - mesoscopic physics , software , computer science , plane (geometry) , artificial intelligence , engineering drawing , computer vision , computer graphics (images) , engineering , geometry , physics , mathematics , programming language , quantum mechanics
Much of the information in micromorphological thin sections exists at the mesoscopic level. The use of flatbed scanners can improve analysis at this level and aid in preservation of the information. This article describes scanning in both plane and cross‐polarized light and discusses the hardware and software required. © 2002 Wiley Periodicals, Inc.