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A review of all‐vanadium redox flow battery durability: Degradation mechanisms and mitigation strategies
Author(s) -
Yuan XiaoZi,
Song Chaojie,
Platt Alison,
Zhao Nana,
Wang Haijiang,
Li Hui,
Fatih Khalid,
Jang Darren
Publication year - 2019
Publication title -
international journal of energy research
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.808
H-Index - 95
eISSN - 1099-114X
pISSN - 0363-907X
DOI - 10.1002/er.4607
Subject(s) - durability , degradation (telecommunications) , vanadium , flow battery , battery (electricity) , reliability engineering , environmental science , process engineering , materials science , electrolyte , computer science , engineering , electrode , chemistry , composite material , metallurgy , power (physics) , physics , quantum mechanics , telecommunications
Summary The all‐vanadium redox flow battery (VRFB) is emerging as a promising technology for large‐scale energy storage systems due to its scalability and flexibility, high round‐trip efficiency, long durability, and little environmental impact. As the degradation rate of the VRFB components is relatively low, less attention has been paid in terms of VRFB durability in comparison with studies on performance improvement and cost reduction. This paper reviews publications on performance degradation mechanisms and mitigation strategies for VRFBs in an attempt to achieve a systematic understanding of VRFB durability. Durability studies of individual VRFB components, including electrolyte, membrane, electrode, and bipolar plate, are introduced. Various degradation mechanisms at both cell and component levels are examined. Following these, applicable strategies for mitigating degradation of each component are compiled. In addition, this paper summarizes various diagnostic tools to evaluate component degradation, followed by accelerated stress tests and models for aging prediction that can help reduce the duration and cost associated with real lifetime tests. Finally, future research areas on the degradation and accelerated lifetime testing for VRFBs are proposed.