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Effect of Parasitic Capacitance on Impedance Measurement and Model Extraction
Author(s) -
Zhang Guoping,
Zhu Rong
Publication year - 2010
Publication title -
electroanalysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 128
eISSN - 1521-4109
pISSN - 1040-0397
DOI - 10.1002/elan.200900324
Subject(s) - parasitic extraction , electrical impedance , capacitance , materials science , extraction (chemistry) , dielectric spectroscopy , noise (video) , parasitic capacitance , electrode , nonlinear system , frequency band , acoustics , parasitic element , biological system , electronic engineering , analytical chemistry (journal) , optoelectronics , computer science , chemistry , physics , electrical engineering , engineering , telecommunications , chromatography , image (mathematics) , quantum mechanics , artificial intelligence , bandwidth (computing) , electrochemistry , biology
Abstract Impedance spectroscopy has been widely used for the characterization of materials and structures. An impedance model can be employed to extract electrical parameters ascribed to the electrical properties of material interiors, boundaries, and external material/electrode interfaces. In an impedance model, a parasitic capacitance exerts an important effect, and is thus an essential to be added. In this paper, dramatic impact of parasitics on impedance spectra and parameter extraction is investigated using theoretical analyses, simulations, and physical experiments. A complex nonlinear least squares fitting method based on a parasitic model together with an I‐V assisted estimation method is proposed for providing more accurate and efficient parameter extraction than previously available solutions. The results also reveal that the low frequency band (below 1 kHz) is not recommended to be used because the impedance measurements are influenced badly by noise. The moderate frequency band (1 kHz–1 MHz) is a recommended range for parameter extraction.