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Imaging the Origins of Coating Degradation and Blistering Caused by Electrolyte Immersion Assisted by SECM
Author(s) -
Souto R. M.,
GonzálezGarcía Y.,
González S.,
Burstein G. T.
Publication year - 2009
Publication title -
electroanalysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 128
eISSN - 1521-4109
pISSN - 1040-0397
DOI - 10.1002/elan.200900262
Subject(s) - blisters , coating , nucleation , electrolyte , materials science , immersion (mathematics) , degradation (telecommunications) , microelectrode , chloride , scanning electrochemical microscopy , chemical engineering , nanotechnology , composite material , chemistry , electrode , metallurgy , electrochemistry , computer science , telecommunications , mathematics , organic chemistry , pure mathematics , engineering
A new method to image the origins of coating degradation and the nucleation and subsequent growth of blisters by using SECM in the feedback mode is proposed. The unique role of chloride ions towards coating performance has been established at a very early stage following immersion of the sample. We believe this to show the earlier stages of blistering in a coated metal system ever recorded. The method allowed for the first time to detect the nucleation and to monitor quantitatively the growth process of an individual blister, because it effectively advanced towards the microelectrode when scanned at constant height over the sample.