Premium
Constant‐Distance Mode Scanning Electrochemical Microscopy. Part II: High‐Resolution SECM Imaging Employing Pt Nanoelectrodes as Miniaturized Scanning Probes
Author(s) -
Ballesteros Katemann Bernardo,
Schulte Albert,
Schuhmann Wolfgang
Publication year - 2004
Publication title -
electroanalysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 128
eISSN - 1521-4109
pISSN - 1040-0397
DOI - 10.1002/elan.200302918
Subject(s) - scanning electrochemical microscopy , materials science , resolution (logic) , liga , scanning probe microscopy , microscopy , optics , nanotechnology , chemistry , electrochemistry , electrode , physics , medicine , alternative medicine , pathology , artificial intelligence , fabrication , computer science
The potential of needle‐type Pt disk nanoelectrodes as extremely miniaturized scanning probes for high resolution scanning electrochemical microscopy (SECM) was investigated. The accuracy of a piezoelectric shear‐force based distance control allowed a precise positioning of the Pt nanoelectrodes in close proximity to the surface of interest not only in tip approach experiments but also throughout scanning and SECM imaging. As proof of the advanced quality of SECM imaging, high‐resolution current and topography images of a three‐dimensional LIGA microstructure will be presented both simultaneously acquired by operating Pt nanoelectrodes in the constant‐distance mode of SECM.