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A method for the investigation of double‐layer effects at solid electrodes
Author(s) -
Mikkelsen Susan R.,
Purdy William C.
Publication year - 1989
Publication title -
electroanalysis
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.574
H-Index - 128
eISSN - 1521-4109
pISSN - 1040-0397
DOI - 10.1002/elan.1140010308
Subject(s) - electrode , double layer (biology) , power network design , drop (telecommunication) , materials science , analytical chemistry (journal) , chemistry , voltage drop , layer (electronics) , thermodynamics , nanotechnology , chromatography , physics , electrical engineering , power (physics) , engineering
The study of double‐layer effects at solid electrodes is often hindered by the lack of precise values for the zero‐charge potentials. This paper presents a method with which the Guoy‐Chapman‐Stern theory can be applied to cyclic voltammetric data in the absence of zero‐charge potential values. The new method uses the voltammetric peak potentials of reversible redox couples as probes of double‐layer structure and requires the elimination of iR drop from the measured values. A new method for the elimination of iR drop is also presented, based on the proportionality of uncompensated resistance to working‐to‐reference electrode distance in an axisymmetric cylindrical cell.