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Front Cover: When Crystals Go Nano – The Role of Advanced X‐ray Total Scattering Methods in Nanotechnology (Eur. J. Inorg. Chem. 34/2018)
Author(s) -
Bertolotti Federica,
Moscheni Daniele,
Guagliardi Antonietta,
Masciocchi Norberto
Publication year - 2018
Publication title -
european journal of inorganic chemistry
Language(s) - English
Resource type - Reports
SCImago Journal Rank - 0.667
H-Index - 136
eISSN - 1099-0682
pISSN - 1434-1948
DOI - 10.1002/ejic.201801051
Subject(s) - front cover , cover (algebra) , chemistry , nanotechnology , scattering , colloid , reciprocal lattice , nano , front (military) , nanocrystal , nanoparticle , x ray , optics , chemical engineering , physics , materials science , mechanical engineering , diffraction , engineering , meteorology
The Front Cover shows a view of the colloidal semiconductor nanocrystals studied by advanced X‐ray Total Scattering methods and reciprocal‐space data analysis. More information can be found in the Microreview by A. Guagliardi, N. Masciocchi et al. For more on the story behind the cover research, see the Cover Profile .