z-logo
Premium
A method for obtaining dielectric characteristics by analyzing residual voltage
Author(s) -
Yamanaka Sanshiro,
Fukuda Tadashi,
Kabeya Takashi,
Sawa Goro,
Ieda Masayuki,
Ito Masayuki,
Kawakami Waichiro
Publication year - 1990
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.4391100602
Subject(s) - materials science , residual , dielectric , voltage , electronic engineering , electrical engineering , computer science , optoelectronics , algorithm , engineering

This content is not available in your region!

Continue researching here.

Having issues? You can contact us here
Accelerating Research

Address

John Eccles House
Robert Robinson Avenue,
Oxford Science Park, Oxford
OX4 4GP, United Kingdom