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Dependence of dielectric breakdown of thin poly (vinylidene fluoride) film on temperature and thickness
Author(s) -
Park Dae Hee,
Yoshino Katsumi,
Okuyama Katsumi,
Ichihara Syouji
Publication year - 1989
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.4391090401
Subject(s) - petrochemical , dielectric , fluoride , materials science , mathematics , engineering physics , electrical engineering , chemistry , physics , engineering , optoelectronics , organic chemistry , inorganic chemistry
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