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High‐speed measurement of critical DV/DT slew rate in thyristors
Author(s) -
Suzuki Masayoshi,
Sagawa Akio,
Kaneko Eiji
Publication year - 1980
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.4391000616
Subject(s) - computer science , library science , operating system
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