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Stability and deterioration mechanism of thick‐film resistors
Author(s) -
Taketa Y.,
Haradome M.
Publication year - 1974
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.4390940319
Subject(s) - microelectronics , citation , library science , electronics , resistor , engineering physics , management , art history , computer science , electrical engineering , engineering , art , economics , voltage