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Application of step‐response test for evaluation of uncertainty of standard measuring system for lightning‐impulse high voltage
Author(s) -
Miyazaki Satoru,
Goshima Hisashi,
Amano Takaaki,
Shinkai Hiroyuki,
Yashima Masafumi,
Wakimoto Takayuki,
Ishii Masaru
Publication year - 2012
Publication title -
electrical engineering in japan
Language(s) - English
Resource type - Journals
SCImago Journal Rank - 0.136
H-Index - 28
eISSN - 1520-6416
pISSN - 0424-7760
DOI - 10.1002/eej.21279
Subject(s) - waveform , voltage divider , voltage , step response , impulse (physics) , electrical engineering , settling time , impulse response , rise time , measurement uncertainty , standard deviation , engineering , electronic engineering , control theory (sociology) , computer science , mathematics , physics , statistics , mathematical analysis , control (management) , quantum mechanics , control engineering , artificial intelligence
In evaluating the uncertainty of the standard measuring system for lightning‐impulse high voltages, which is composed of a standard voltage divider, a digital recorder, and calibrators, step‐response tests of the standard voltage divider may be useful. In this paper, a convolution algorithm is employed to calculate the output impulse voltage waveforms from measured step‐response waveforms. The uncertainties of peak‐value measurement due to the influence of the nominal epoch, uncertainty of the peak‐value measurement due to dispersion of the AC scale factor, and uncertainty of the virtual front‐time measurement due to long‐term stability are evaluated. Furthermore, the error of the virtual front time of the output waveforms is discussed. The front part of the step‐response waveform, t ≤ T 30 %, does not influence the error of the virtual front time. Therefore, for the standard voltage divider, the step‐response parameters, that is, the experimental response time, partial response time, settling time, and overshoot, have almost nothing to do with the error of the virtual front time. © 2012 Wiley Periodicals, Inc. Electr Eng Jpn, 180(2): 24–32, 2012; Published online in Wiley Online Library ( wileyonlinelibrary.com ). DOI 10.1002/eej.21279